Atom Probe Tomography of Electronic Materials von Kelly, Thomas F, Larson, David J, Thompson, Keith, Alvis, Roger L, Bunton, Joseph H, Olson, Jesse D, Gorman, Brian P

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Atom probe tomography today von Cerezo, Alfred, Clifton, Peter H., Galtrey, Mark J., Humphreys, Colin J., Kelly, Thomas F., Larson, David J., Lozano-Perez, Sergio, Marquis, Emmanuelle A., Oliver, Rachel A., Sha, Gang, Thompson, Keith, Zandbergen, Mathijs, Alvis, Roger L.

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Three-dimensional atomic-scale mapping of Pd in Ni1−xPdxSi∕Si(100) thin films von Kim, Yeong-Cheol, Adusumilli, Praneet, Lauhon, Lincoln J., Seidman, David N., Jung, Soon-Yen, Lee, Hi-Deok, Alvis, Roger L., Ulfig, Rob M., Olson, Jesse D.

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Three-dimensional atomic-scale mapping of Pd in Ni 1 − x Pd x Si ∕ Si ( 100 ) thin films von Kim, Yeong-Cheol, Adusumilli, Praneet, Lauhon, Lincoln J., Seidman, David N., Jung, Soon-Yen, Lee, Hi-Deok, Alvis, Roger L., Ulfig, Rob M., Olson, Jesse D.

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Observation of diamond nanocrystals in carbon films deposited during ion-assisted microwave plasma nucleation pretreatments von McGinnis, Sean P., Kelly, Michael A., Hagström, Stig B., Alvis, Roger L.

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Method and apparatus for a line based, two-dimensional characterization of a three-dimensional surface von Alvis, Roger L

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Method and apparatus for a line based, two-dimensional characterization of a three-dimensional surface von ALVIS ROGER L

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Method for precise temperature sensing and control of semiconductor structures von ALVIS ROGER L

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Line based characterization of a complex surface von ROGER L. ALVIS

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LINE BASED CHARACTERIZATION OF A COMPLEX SURFACE von ALVIS, ROGER, L

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Semiconductor fabrication with multiple low dose implant von ALVIS ROGER L, ISHIDA EMI

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Semiconductor fabrication with multiple low dose implant von Alvis, Roger L, Ishida, Emi

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Electron beam emitting tungsten filament von TRACY, BRYAN, GRAY, JANICE, ALVIS, ROGER L

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Method of forming electron beam emitting tungsten filament von TRACY, BRYAN, GRAY, JANICE, ALVIS, ROGER L

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Scanning spreading resistance probe von ERICKSON, ANDREW N, ALVIS, ROGER L

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Energy filtering for electron back-scattered diffraction patterns von DINGLEY, DAVID J, ALVIS, ROGER L

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Method of accurate compositional analysis of dielectric films on semiconductors von ALVIS, ROGER L, ROMERO, JEREMIAS D, FATEMI, HOMI

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A METHOD OF ACCURATE COMPOSITIONAL ANALYSIS OF DIELECTRIC FILMS ON SEMICONDUCTORS von ALVIS, ROGER, L, ROMERO, JEREMIAS, D, FATEMI, HOMI

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ABRASIVE-FREE SELECTIVE CHEMO-MECHANICAL POLISH FOR TUNGSTEN von ALVIS, ROGER, L, THOMPSON, LILIANA, BESSER, PAUL, R

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A PROCESS FOR IN-SITU DEPOSITION OF A Ti/TiN BARRIER METAL STACK von ALVIS, ROGER, L, IACOPONI, JOHN, A, BESSER, PAUL, R, TRAN, KHANH, Q

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