GLACIER: a hot carrier gate level circuit characterization and simulation system for VLSI design von Lifeng Wu, Jingkun Fang, Hirokazu Yonezawa, Yoshiyuki Kawakami, Nobufusa Iwanishi, Heting Yan, Ping Chen, Alvin I-Hsien Chen, Norio Koike, Yoshifumi Okamoto, Chune-Sin Yeh, Zhihong Liu

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Gate-level aged timing simulation methodology for hot-carrier reliability assurance von Kawakami, Yoshiyuki, Fang, Jingkun, Yonezawa, Hirokazu, Iwanishi, Nobufusa, Wu, Lifeng, Chen, Alvin I-Hsien, Koike, Norio, Chen, Ping, Yeh, Chune-Sin, Liu, Zhihong

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Hot carrier effect simulation for integrated circuits von CHEN PING, YEH CHUNE-SIN, CHEN ALVIN I-HSIEN, FANG JINGKUN, IWANISHI NOBUFUSA, KOIKE NORIO, WU LIFENG, YONEZAWA HIROKAZU, KAWAKAMI YOSHIYUKI, LIU ZHIHONG

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