Characterizing novel Indium Phosphide pad detectors with focused X-ray beams and laboratory tests von Almazan, E.R., Affolder, A., Dyckes, I., Fadeyev, V., Hance, M., Jadhav, M., Kim, S., McCoy, T., Metcalfe, J., Nielsen, J., Ott, J., Poley, L., Shin, T.(K.-W.), Sperlich, D., Sumant, A.

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