Development of a Charge-Multiplication CMOS Image Sensor Based on Capacitive Trench for Low-Light-Level Imaging von Marcelot, Olivier, Morvan, Marjorie, Salih Alj, Antoine, Demiguel, Stephane, Virmontois, Cedric, Rouvie, Anne, Estribeau, Magali, Goiffon, Vincent

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Capacitive Deep Trench Isolation based CCD-on-CMOS Image Sensor Sensitivity to Total Ionizing Dose von Alj, Antoine Salih, Touron, Pierre, Roy, Francois, Demiguel, Stephane, Michelot, Julien, Virmontois, Cedric, Magnan, Pierre, Goiffon, Vincent

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Dark Current and Clock-Induced Charges in a Fully Depleted Charge Domain CDTI-Based CCD-on-CMOS Image Sensor von Salih Alj, Antoine, Touron, Pierre, Roy, Francois, Tournier, Arnaud, Michelot, Julien, Demiguel, Stephane, Virmontois, Cedric, Lalucaa, Valerian, Magnan, Pierre, Goiffon, Vincent

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Displacement Damage Induced Dark Current and Random Telegraph Signal in P-Type Deep-Trench Pinned Photogates von Antonsanti, Aubin, Malherbe, Victor, Alj, Antoine Salih, Roch, Alexandre Le, Ryder, Landen D., Roche, Philippe, Tournier, Arnaud, Virmontois, Cedric, Lauenstein, Jean-Marie, Goiffon, Vincent

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Total Ionizing Dose Effects on a CDTI-Based CCD-on-CMOS Through Buildup of Interface Traps and Oxide Charges von Alj, Antoine Salih, Touron, Pierre, Roy, Francois, Demiguel, Stephane, Michelot, Julien, Lalucaa, Valerian, Virmontois, Cedric, Magnan, Pierre, Goiffon, Vincent

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Displacement Damage Effects on a CDTI-based CCD-on-CMOS: Dark Current and Charge Transfer Inefficiency von Alj, Antoine Salih, Antonsanti, Aubin, Roch, Alexandre Le, Touron, Pierre, Roy, Francois, Tournier, Arnaud, Demiguel, Stephane, Michelot, Julien, Lalucaa, Valerian, Virmontois, Cedric, Magnan, Pierre, Goiffon, Vincent

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