Strain-induced modulation of perpendicular magnetic anisotropy in Ta/CoFeB/MgO structures investigated by ferromagnetic resonance von Yu, Guoqiang, Wang, Zhenxing, Abolfath-Beygi, Maryam, He, Congli, Li, Xiang, Wong, Kin L., Nordeen, Paul, Wu, Hao, Carman, Gregory P., Han, Xiufeng, Alhomoudi, Ibrahim A., Amiri, Pedram Khalili, Wang, Kang L.

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Residual stresses and Raman shift relation in anatase TiO2 thin film von ALHOMOUDI, Ibrahim A, NEWAZ, G

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Growth and Strain Evaluation of InGaP/InGaAs/Ge Triple-Junction Solar Cell Structures von Alhomoudi, Ibrahim A.

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In-Plane High-Sensitivity Capacitive Accelerometer in a 3-D CMOS-Compatible Surface Micromachining Process von Alfaifi, Ahmad, Alhomoudi, Ibrahim A., Nabki, Frederic, El-Gamal, Mourad N.

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Comparative analysis of modeling and experiments to study spalling process in Si wafers von Alhomoudi, Ibrahim A.

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Erratum: “Strain-induced modulation of perpendicular magnetic anisotropy in Ta/CoFeB/MgO structures investigated by ferromagnetic resonance” [Appl. Phys. Lett. 106 , 072402 (2015)]... von Yu, Guoqiang, Wang, Zhenxing, Abolfath-Beygi, Maryam, He, Congli, Li, Xiang, Wong, Kin L., Nordeen, Paul, Wu, Hao, Ong, P. V., Kioussis, Nicholas, Carman, Gregory P., Han, Xiufeng, Alhomoudi, Ibrahim A., Khalili Amiri, Pedram, Wang, Kang L.

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Anti-soiling surfaces for PV applications prepared by sol-gel processing: Comparison of laboratory testing and outdoor exposure von Bahattab, Mohammed A., Alhomoudi, Ibrahim A., Alhussaini, Mohammed I., Mirza, Mark, Hegmann, Jan, Glaubitt, Walther, Löbmann, Peer

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Residual stresses and Raman shift relation in anatase TiO 2 thin film von Alhomoudi, Ibrahim A., Newaz, G.

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Reflective light collecting enclosure for a light meter von Mirza, Mark, Alhomoudi, Ibrahim A, Alhussaini, Mohammed I, Glaubitt, Walther, Bahattab, Mohammed A

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ILLUMINATION MEASURING MODULE von Bahattab Mohammed A, Mirza Mark, Glaubitt Walther, Alhussaini Mohammed I, Alhomoudi Ibrahim A

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Factors Directing Preclinical Medical Students towards Specialty of Choice von Shacfe, Fathiah Nadine Hasan, Alhomoudi, Reham Ibrahim, Peeran, Ahmed Aftab, Abdeh, Amal Iman, Obad, Adam Subait, Shareef, Mohammed Abrar

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CMOS compatible capacitive absolute pressure sensors von Alhomoudi, Ibrahim Abdullah, Alsaiary, Tariq Salim

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Spalling method utilizing stressor layer portions von ALHOMOUDI IBRAHIM, FOGEL KEITH E, LI NING, BEDELL STEPHEN W, LAURO PAUL A, SADANA DEVENDRA K

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CMOS COMPATIBLE CAPACITIVE ABSOLUTE PRESSURE SENSORS von ALHOMOUDI IBRAHIM ABDULLAH, ALSAIARY TARIQ SALIM

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AN ILLUMINATION MEASURING MODULE von BAHATTAB, Mohammed, MIRZA, Mark, GLAUBITT, Walther, ALHUSSAINI, Mohammed, ALHOMOUDI, Ibrahim

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AN ILLUMINATION MEASURING MODULE von BAHATTAB, Mohammed, MIRZA, Mark, GLAUBITT, Walther, ALHUSSAINI, Mohammed, ALHOMOUDI, Ibrahim

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Method for improving quality of spalled material layers von Sadana, Devendra K, Bedell, Stephen W, Li, Ning, Fogel, Keith E, Lauro, Paul A, Alhomoudi, Ibrahim, Saenger, Katherine L

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METHOD FOR IMPROVING QUALITY OF SPALLED MATERIAL LAYERS von Saenger Katherine L, Sadana Devendra K, Alhomoudi Ibrahim, Bedell Stephen W, Li Ning, Fogel Keith E, Lauro Paul A

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Method for improving quality of spalled material layers von Saenger Katherine L, Sadana Devendra K, Alhomoudi Ibrahim, Bedell Stephen W, Li Ning, Fogel Keith E, Lauro Paul A

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Abtrennen unter Verwendung von Teilbereichen einer Stressorschicht von Sadana, Devendra K, Bedell, Stephen W, Li, Ning, Fogel, Keith E, Lauro, Paul A, Alhomoudi, Ibrahim

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