Synchrotron-based Mössbauer spectroscopy characterization of sublimated spin crossover molecules von Cini, Alberto, Poggini, Lorenzo, Chumakov, Alexander I, Rüffer, Rudolf, Spina, Gabriele, Wattiaux, Alain, Duttine, Mathieu, Gonidec, Mathieu, Fittipaldi, Maria, Rosa, Patrick, Mannini, Matteo

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Nonstable Latchups in CMOS ICs Under Pulsed Laser Irradiation von Shvetsov-Shilovskiy, Ivan I., Chumakov, Alexander I., Pechenkin, Alexander A., Bobrovsky, Dmitry V.

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Possibilities and limitations of focused laser technique application for SEE sensitivity parameters estimation von Chumakov, Alexander I.

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Some aspects of IC radiation hardness evaluation to the effects of high-energy ions von Chumakov, Alexander I., Bobrovsky, Dmitry V., Sogoyan, Armen V.

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Temperature Dependence of MCU Sensitivity in 65 nm CMOS SRAM von Boruzdina, Anna B., Sogoyan, Armen V., Smolin, Anatoly A., Ulanova, Anastasia V., Gorbunov, Maxim S., Chumakov, Alexander I., Boychenko, Dmitry V.

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Single event effects qualificatoin of integrated circuits von Sogoyan, Armen V., Smolin, Anatoly A., Chumakov, Alexander I.

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Rocking curve measurements revisited von Masiello, Fabio, Cembali, Gianfranco, Chumakov, Alexander I., Connell, Simon H., Ferrero, Claudio, Härtwig, Jürgen, Sergeev, Ilya, Van Vaerenbergh, Pierre

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Some aspects of IC radiation hardness evaluation when exposed to neutrons von Chumakov, Alexander I., Sogoyan, Armen V., Bobrovsky, Dmitry V., Titovets, Dmitry O., Chumakov, Konstantin A., Diankov, Sergey Y., Khaustov, Vitaly V., Gerasimchuk, Oleg A., Yurkov, Dmitry I.

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Evaluating CMOS chip sensitivity parameters to single event upsets under influence of neutrons by the burst generation rate function von Titovets, Dmitry O., Kravchenko, Nikolay D., Karakozov, Andrey B., Chumakov, Alexander I., Bobrovsky, Dmitry V.

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Hardness assurance levels and requirements for single event effects testing of integrated circuits von Chumakov, Alexander I., Sogoyan, Armen V., Smolin, Anatoly A., Ahmetov, Alexey O., Bobrovsky, Dmitry V., Boychenko, Dmitry V., Ryasnoy, Nikolai V., Chumakov, Konstantin A., Churilin, Evgeny V., Gerasimov, Vladimir F., Khaustov, Vitaly V., Sashov, Alexander A., Ulanova, Anastasia V., Yanenko, Andrey V.

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Analysis of SOI CMOS Microprocessor's SEE Sensitivity: Correlation of the Results Obtained by Different Test Methods von Gorbunov, Maxim S., Vasilegin, Boris V., Antonov, Andrey A., Osipenko, Pavel N., Zebrev, Gennady I., Anashin, Vasily S., Emeliyanov, Vladimir V., Ozerov, Alexander I., Useinov, Rustem G., Chumakov, Alexander I., Pechenkin, Alexander A., Yanenko, Andrey V.

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The influence of an impulsed ion radiation on the sensitivity parameters of integrated circuits to single event effects von Alexander I. Chumakov, Dmitry V. Bobrovsky, Sergey A. Soloviev

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SEE rate estimation based on diffusion approximation of charge collection von Sogoyan, Armen V., Chumakov, Alexander I., Smolin, Anatoly A.

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Single event effects radiation testing requirements: a minimax approach von Armen V. Sogoyan, Alexander I. Chumakov, Anastasia V. Ulanova, Anatoly A. Smolin, Andrey V. Yanenko, Dmitry V. Boychenko

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A simple analytical model of single-event upsets in bulk CMOS von Sogoyan, Armen V., Chumakov, Alexander I., Smolin, Anatoly A., Ulanova, Anastasia V., Boruzdina, Anna B.

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Russian Philosophy in the Twenty-First Century: An Anthology von Sergeev, Mikhail, Chumakov, Alexander N, Theis, Mary

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Nuclear inelastic scattering and Mössbauer spectroscopy as local probes for ligand binding modes and electronic properties in proteins: vibrational behavior of a ferriheme center i... von Moeser, Beate, Janoschka, Adam, Wolny, Juliusz A, Paulsen, Hauke, Filippov, Igor, Berry, Robert E, Zhang, Hongjun, Chumakov, Aleksandr I, Walker, F Ann, Schünemann, Volker

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Magnetic and structural properties of the iron silicide superconductor LaFeSiH von Hansen, M. F., Layek, S., Vaney, J.-B., Chaix, L., Suchomel, M. R., Mikolasek, M., Garbarino, G., Chumakov, A., Rüffer, R., Nassif, V., Hansen, T., Elkaim, E., Pelletier, T., Mayaffre, H., Bernardini, F., Sulpice, A., Núñez-Regueiro, M., Rodière, P., Cano, A., Tencé, S., Toulemonde, P., Julien, M.-H., d'Astuto, M.

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Fault-Tolerant SOI Microprocessor for Space Applications von Osipenko, Pavel N., Antonov, Andrey A., Klishin, Alexander V., Vasilegin, Boris V., Gorbunov, Maxim S., Dolotov, Pavel S., Zebrev, Gennady I., Anashin, Vasily S., Emeliyanov, Vladimir V., Ozerov, Alexander I., Chumakov, Alexander I., Yanenko, Andrey V., Vasiliev, Alexey L.

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"PICO-4" Single Event Effects Evaluation and Testing Facility Based on Wavelength Tunable Picosecond Laser von Egorov, A. N., Chumakov, A. I., Mavritskiy, O. B., Pechenkin, A. A., Koltsov, D., Yanenko, A. V.

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