Evaluation of Funnel Models on Calculation of Ion-Induced Collected Charge von Aguiar, Vitor A. P., Medina, Nilberto H., Added, Nemitala, Alberton, Saulo G., Macchione, Eduardo L. A., Guazzelli, Marcilei A., Melo, Marco A. A., Oliveira, Juliano A., Giacomini, Renato C., Aguirre, Fernando R., Allegro, Paula R. P., Zaggato, Hellen C. S., Sayeg, Isaac J.

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Unsupervised machine learning application to identify single-event transients (SETs) from noise events in MOSFET transistor ionizing radiation effects von Allegro, Paula R.P., Toufen, Dennis L., Aguiar, Vitor A.P., dos Santos, Lucas S.A., de Oliveira, William N., Added, Nemitala, Medina, Nilberto H., Macchione, Eduardo L.A., Alberton, Saulo G., Guazzelli, Marcilei A., Melo, Marco A.A., Oliveira, Juliano A.

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Charge deposition analysis of heavy-ion-induced single-event burnout in low-voltage power VDMOSFET von Alberton, Saulo G., Aguiar, V.A.P., Medina, N.H., Added, N., Macchione, E.L.A., Menegasso, R., Cesário, G.J., Santos, H.C., Scarduelli, V.B., Alcántara-Núñez, J.A., Guazzelli, M.A., Santos, R.B.B., Flechas, D.

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Effects of Neutron Radiation on the Thermal Conductivity of Highly Oriented Pyrolitic Graphite von Guazzelli, Marcilei A, Avanzi, Luis H, Aguiar, Vitor A P, Vilas-Bôas, Alexis C, Alberton, Saulo G, Masunaga, Sueli H, Chinaglia, Eliane F, Araki, Koiti, Nakamura, Marcelo, Toyama, Marcos M, Ferreira, Fabio F, Escote, Marcia T, Santos, Roberto B B, Medina, Nilberto H, Oliveira, José Roberto B, Cappuzzello, Francesco, Cavallaro, Manuela, the NUMEN collaboration

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