The effect of imprint on remanent piezoelectric properties and ferroelectric aging of PbZr0.52Ti0.48O3 thin films von Akkopru‐Akgun, Betul, Zhu, Wanlin, Lanagan, Michael T., Trolier‐McKinstry, Susan

Volltext

Thermally stimulated depolarization current measurements on degraded lead zirconate titanate films von Akkopru‐Akgun, Betul, Marincel, Daniel M., Tsuji, Kosuke, Bayer, Thorsten J. M., Randall, Clive A., Lanagan, Michael T., Trolier‐McKinstry, Susan

Volltext

MnO2 thin film electrodes for enhanced reliability of thin glass capacitors von Akkopru‐Akgun, Betul, Trolier‐McKinstry, Susan, Lanagan, Michael T.

Volltext

MnO2 Thin Film Electrodes for Enhanced Reliability of Thin Glass Capacitors von Akkopru-Akgun, Betul, Trolier-McKinstry, Susan, Lanagan, Michael T

Volltext

Effect of Mg-doping and Fe-doping in lead zirconate titanate (PZT) thin films on electrical reliability von Koh, Dongjoo, Ko, Song Won, Yang, Jung In, Akkopru-Akgun, Betul, Trolier-McKinstry, Susan

Volltext

Highly accelerated lifetime testing of potassium sodium niobate thin films von Zhu, Wanlin, Akkopru-Akgun, Betul, Trolier-McKinstry, Susan

Volltext

Wake up and retention in zinc magnesium oxide ferroelectric films von Jacques, Leonard, Ryu, Gyunghyun, Goodling, Devin, Bachu, Saiphaneendra, Taheri, Rojin, Yousefian, Pedram, Shetty, Smitha, Akkopru-Akgun, Betul, Randall, Clive, Alem, Nasim, Maria, Jon-Paul, Trolier-McKinstry, Susan

Volltext

Electrochemically driven degradation of chemical solution deposited ferroelectric thin-films in humid ambient von Dahl-Hansen, Runar Plünnecke, Polfus, Jonathan Marc, Vøllestad, Einar, Akkopru-Akgun, Betul, Denis, Lyndsey, Coleman, Kathleen, Tyholdt, Frode, Trolier-McKinstry, Susan, Tybell, Thomas

Volltext

Colossal Strain Tuning of Ferroelectric Transitions in KNbO 3 Thin Films von Hazra, Sankalpa, Schwaigert, Tobias, Ross, Aiden, Lu, Haidong, Saha, Utkarsh, Trinquet, Victor, Akkopru-Akgun, Betul, Gregory, Benjamin Z, Mangu, Anudeep, Sarker, Suchismita, Kuznetsova, Tatiana, Sarker, Saugata, Li, Xin, Barone, Matthew R, Xu, Xiaoshan, Freeland, John W, Engel-Herbert, Roman, Lindenberg, Aaron M, Singer, Andrej, Trolier-McKinstry, Susan, Muller, David A, Rignanese, Gian-Marco, Salmani-Rezaie, Salva, Stoica, Vladimir A, Gruverman, Alexei, Chen, Long-Qing, Schlom, Darrell G, Gopalan, Venkatraman

Volltext

Polarity dependent DC resistance degradation and electrical breakdown in Nb doped PZT films von Akkopru-Akgun, Betul, Zhu, Wanlin, Randall, Clive A., Lanagan, Michael T., Trolier-McKinstry, Susan

Volltext

Ultraviolet-assisted cold poling of Pb(Zr0.52Ti0.48)O3 films von Zhu, Wanlin, Luo, Wei, Akkopru-Akgun, Betul, Lanagan, Michael, Randall, Clive A., Trolier-McKinstry, Susan

Volltext

MnO 2 Thin Film Electrodes for Enhanced Reliability of Thin Glass Capacitors von Akkopru‐Akgun, Betul, Trolier‐McKinstry, Susan, Lanagan, Michael T

Volltext

Silver containing sol–gel derived silica thin films: effect of aluminum incorporation on optical, microstructural and bactericidal properties von Akgun, Betul Akkopru, Mellott, Nathan P., Durucan, Caner

Volltext

Tuning Nb Solubility, Electrical Properties, and Imprint through PbO Stoichiometry in PZT Films von Akkopru-Akgun, Betul, Trolier-McKinstry, Susan

Volltext

Links between defect chemistry, conduction, and lifetime in heavily Nb doped lead zirconate titanate films von Akkopru-Akgun, Betul, Wang, Ke, Trolier-McKinstry, Susan

Volltext

Influence of graded doping on the long-term reliability of Nb-doped lead zirconate titanate films von Zhu, Wanlin, Akkopru-Akgun, Betul, Yang, Jung In, Fragkiadakis, Charalampos, Wang, Ke, Ko, Song Won, Mardilovich, Peter, Trolier-McKinstry, Susan

Volltext

The influence of Mn doping on the leakage current mechanisms and resistance degradation behavior in lead zirconate titanate films von Akkopru-Akgun, Betul, Bayer, Thorsten J.M., Tsuji, Kosuke, Randall, Clive A., Lanagan, Michael T., Trolier-McKinstry, Susan

Volltext

Erratum: “Highly accelerated lifetime testing of potassium sodium niobate thin films” [Appl. Phys. Lett. 111, 212903 (2017)] von Zhu, Wanlin, Akkopru-Akgun, Betul, Trolier-McKinstry, Susan

Volltext

Leakage current characteristics and DC resistance degradation mechanisms in Nb doped PZT films von Akkopru-Akgun, Betul, J. M., Thorsten, Tsuji, Kosuke, Wang, Ke, Randall, Clive A., Lanagan, Michael T., Trolier-McKinstry, Susan

Volltext

Frequency dependence of wake-up and fatigue characteristics in ferroelectric Al0.93B0.07N thin films von He, Fan, Zhu, Wanlin, Hayden, John, Casamento, Joseph, Tran, Quyen, Kang, Kyuhwe, Song, Yiwen, Akkopru-Akgun, Betul, Yang, Jung In, Tipsawat, Pannawit, Brennecka, Geoff, Choi, Sukwon, Jackson, Thomas N., Maria, Jon-Paul, Trolier-McKinstry, Susan

Volltext