Crystallization of TiO2 polymorphs from RF-sputtered, amorphous thin-film precursors von Agirseven, O., Rivella, D. T., Haggerty, J. E. S., Berry, P. O., Diffendaffer, K., Patterson, A., Kreb, J., Mangum, J. S., Gorman, B. P., Perkins, J. D., Chen, B. R., Schelhas, L. T., Tate, J.

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Optical, electrical and microstructural properties of SiC thin films deposited by reactive dc magnetron sputtering von Tavsanoglu, T., Zayim, E.O., Agirseven, O., Yildirim, S., Yucel, O.

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Crystallization of TiO2 polymorphs from RF-sputtered, amorphous thin-film precursors von Agirseven, O., Rivella, D. T., Haggerty, J. E. S., Berry, P. O., Diffendaffer, K., Patterson, A., Kreb, J., Mangum, J. S., Gorman, B. P., Perkins, J. D., Chen, B. R., Schelhas, L. T., Tate, J.

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An imaging SIMS study on the tribological properties of boron carbide thin films von Tavsanoglu, Tolga, Jeandin, Michel, Addemir, Okan, Agirseven, Okan, Yucel, Onuralp

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