X-ray scattering study of Ag/Si(111) buried interface structures von HAWOONG HONG, ABURANO, R. D, LIN, D.-S, HAYDN CHEN, CHIANG, T.-C, ZSCHACK, P, SPECHT, E. D

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Structural determination of the [formula omitted] interface via X-ray diffraction von Kidd, Tim, Aburano, R.D., Hong, Hawoong, Gog, T., Chiang, T.-C.

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X-ray study of the [formula omitted] interface von Aburano, R.D., Hong, Hawoong, Roesler, J.M., Lin, D.-S., Chiang, T.-C., Zschack, P.

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X-ray truncation rod study of Ge(001) surface roughening by molecular beam homoepitaxial growth von Hong, Hawoong, Aburano, R. D., Chung, Ki-Sup, Lin, D.-S., Hirschorn, E. S., Chiang, T.-C., Chen, Haydn

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C[sub 60] encapsulation of the Si(111)-(7[times]7) surface von Hong, H., McMahon, W.E., Zschack, P., Lin, D., Aburano, R.D., Chen, H., Chiang, T.

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Boundary-structure determination of Ag/Si(111) interfaces by x-ray diffraction von Aburano, RD, Hong, H, Roesler, JM, Chung, K, Lin, D, Zschack, P, Chen, H, Chiang, T

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Interaction of (1[times]2)-reconstructed Si(100) and Ag(110):Cs surfaces with C[sub 60] overlayers von Hong, H., Aburano, R.D., Hirschorn, E.S., Zschack, P., Chen, H., Chiang, T.

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