The empirical verification of the FEM model of semiconductor pressure sensor von Pancewicz, Tomasz, Jachowicz, Ryszard, Gniazdowski, Zenon, Ażgin, Zbigniew, Kowalski, Paweł

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FET pressure sensor and iterative method for modelling of the device von Jachowicz, Ryszard S., Ażgin, Zbigniew M.

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Integrated circuits protection with the Langmuir–Blodgett Films von Fabianowski, Wojciech, Jachowicz, Ryszard, Karpińska, Aleksandra, Ażgin, Zbigniew

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Model thin films of controlled thickness and composition von FABIANOWSKI, WOJCIECH, ZIENTEK, KATARZYNA, JACHOWICZ, RYSZARD, AZGIN, ZBIGNIEW

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