Inversion Charge Study in TMO Hole-Selective Contact-Based Solar Cells von Garcia-Hernansanz, R., Perez-Zenteno, F., Duarte-Cano, S., Caudevilla, D., Algaidy, S., Garcia-Hemme, E., Olea, J., Pastor, D., del Prado, A., Andres, E. San, Martil, I., Ros, E., Puigdollers, J., Ortega, P., Voz, C.

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Ti supersaturated Si by microwave annealing processes von Olea, J, González-Díaz, G, Pastor, D, García-Hemme, E, Caudevilla, D, Algaidy, S, Pérez-Zenteno, F, Duarte-Cano, S, García-Hernansanz, R, del Prado, A, Andrés, E San, Mártil, I, Lee, Yao-Jen, Hong, Tzu-Chieh, Chao, Tien-Sheng

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High quality Ti-implanted Si layers above the Mott limit von Olea, J., Toledano-Luque, M., Pastor, D., San-Andrés, E., Mártil, I., González-Díaz, G.

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Nano-laminate vs. direct deposition of high permittivity gadolinium scandate on silicon by high pressure sputtering von Feijoo, P.C., Pampillón, M.A., San Andrés, E., Fierro, J.L.G.

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A robust method to determine the contact resistance using the van der Pauw set up von González-Díaz, G., Pastor, D., García-Hemme, E., Montero, D., García-Hernansanz, R., Olea, J., del Prado, A., San Andrés, E., Mártil, I.

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Optimization of scandium oxide growth by high pressure sputtering on silicon von Feijoo, P.C., Pampillón, M.A., San Andrés, E., Lucía, M.L.

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Gadolinium scandate by high-pressure sputtering for future generations of high-κ dielectrics von Feijoo, P C, Pampillón, M A, San Andrés, E, Fierro, J L G

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A Reliable Metric for Mobility Extraction of Short-Channel MOSFETs von Severi, S., Pantisano, L., Augendre, E., San Andres, E., Eyben, P., De Meyer, K.

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Scavenging effect on plasma oxidized Gd2O3 grown by high pressure sputtering on Si and InP substrates von Pampillón, M A, Feijoo, P C, San Andrés, E, García, H, Castán, H, Dueñas, S

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RF Split Capacitance-Voltage Measurements of Short-Channel and Leaky MOSFET Devices von Andres, E.S., Pantisano, L., Ramos, J., Severi, S., Trojman, L., De Gendt, S., Groeseneken, G.

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Anomalous thermal oxidation of gadolinium thin films deposited on silicon by high pressure sputtering von Pampillón, M.A., Feijoo, P.C., San Andrés, E., Lucía, M.L., del Prado, A., Toledano-Luque, M.

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Electronic transport properties of Ti-supersaturated Si processed by rapid thermal annealing or pulsed-laser melting von Olea, J, González-Díaz, G, Pastor, D, García-Hemme, E, Caudevilla, D, Algaidy, S, Pérez-Zenteno, F, Duarte-Cano, S, García-Hernansanz, R, del Prado, A, San Andrés, E, Mártil, I

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Transport mechanisms in hyperdoped silicon solar cells von García-Hernansanz, R, Duarte-Cano, S, Pérez-Zenteno, F, Caudevilla, D, Algaidy, S, García-Hemme, E, Olea, J, Pastor, D, Del Prado, A, San Andrés, E, Mártil, I, Ros, E, Puigdollers, J, Ortega, P, Voz, C

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High-pressure sputtering deposition and in situ plasma oxidation of TiOx thin films as electron selective contact for photovoltaic applications von Pérez-Zenteno, F., García-Hemme, E., Torres, I., Barrio, R., Duarte, S., Benítez-Fernández, R., Caudevilla, D., García-Hernansanz, R., Olea, J., Pastor, D., Prado, A. del, San Andrés, E.

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High-quality single-crystalline epitaxial regrowth on pulsed laser melting of Ti implanted GaAs von Algaidy, S., Caudevilla, D., Perez-Zenteno, F., García-Hernansanz, R., García-Hemme, E., Olea, J., San Andrés, E., Duarte-Cano, S., Siegel, J., Gonzalo, J., Pastor, D., del Prado, A.

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Indium tin oxide obtained by high pressure sputtering for emerging selective contacts in photovoltaic cells von Caudevilla, D., García-Hemme, E., San Andrés, E., Pérez-Zenteno, F., Torres, I., Barrio, R., García-Hernansanz, R., Algaidy, S., Olea, J., Pastor, D., del Prado, A.

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Electrical transport properties in Ge hyperdoped with Te von Caudevilla, D, Algaidy, S, Pérez-Zenteno, F, Duarte-Cano, S, García-Hernansanz, R, Olea, J, San Andrés, E, del Prado, A, Barrio, R, Torres, I, García-Hemme, E, Pastor, D

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Positive bias temperature instabilities on sub-nanometer EOT FinFETs von Feijoo, P.C., Cho, M., Togo, M., San Andrés, E., Groeseneken, G.

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Negligible Effect of Process-Induced Strain on Intrinsic NBTI Behavior von Shickova, A., Kaczer, B., Verheyen, P., Eneman, G., Andres, E.S., Jurczak, M., Absil, P., Maes, H., Groeseneken, G.

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Electrical characterization of high-pressure reactive sputtered ScOx films on silicon von CASTAN, H, DUENAS, S, GOMEZ, A, GARCIA, H, BAILON, L, FEIJOO, P. C, TOLEDANO-LUQUE, M, DEL PRADO, A, SAN ANDRES, E, LUCIA, M. L

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