Post-metallization annealing of metal-tunnel oxide-silicon diodes von LUNDGREN, P, ANDERSSON, M. O, FARMER, K. R

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Tunnel electron induced charge generation in very thin silicon oxide dielectrics von FARMER, K. R, ANDERSSON, M. O, ENGSTROM, O

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Time-dependent positive charge generation in very thin silicon oxide dielectrics von FARMER, K. R, ANDERSSON, M. O, ENGSTRÖM, O

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Temperature dependence confirmation of tunneling through 2–6 nm silicon dioxide von Lundgren, P., Andersson, M.O.

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The effects of HF cleaning prior to silicon wafer bonding von LUNGBERG, K, BÄCKLUND, Y, SÖDERBÄRG, A, BERGH, M, ANDERSSON, M. O, BENGTSSON, S

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Surface potential dependence of interface state passivation in metal-tunnel oxide-silicon diodes von Andersson, M.O., Lundgren, A., Lundgren, P.

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Negative charging in ultrathin metal-oxide-silicon tunnel diodes von ANDERSSON, M. O, FARMER, K. R, ENGSTRÖM, O

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The bonded unipolar silicon-silicon junction von BENGTSSON, S, ANDERSSON, G. I, ANDERSSON, M. O, ENGSTRÖM, O

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Discrete conductance fluctuations in silicon emitter junctions due to defect clustering and evidence for structural changes by high-energy electron irradiation and annealing von ANDERSSON, G. I, ANDERSSON, M. O, ENGSTRÖM, O

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Oxide thickness- and bias-dependence of postmetallization annealing of interface states in metal-oxide-silicon diodes von RAGNARSSON, L.-A, LUNDGREN, P, OVUKA, Z, ANDERSSON, M. O

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Electrical instability of ultrathin thermal oxides on silicon von Lundgren, P., Andersson, M.O., Farmer, K.R., Engström, O.

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Electrical characterization of bonding interfaces von ENGSTRÖM, O, BENGTSSON, S, ANDERSSON, G. I, ANDERSSON, M. O, JAUHIAINEN, A

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Wafer bonding induced degradation of thermal silicon dioxide layers on silicon von Afanas’ev, V. V., Ericsson, P., Bengtsson, S., Andersson, M. O.

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Annealing and charging of slow and fast states in metal-tunnel oxide-silicon diodes measured using capacitance-voltage and current-voltage techniques von Andersson, M.O., Lundgren, P., Engström, O., Farmer, K.R.

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Weak fluence dependence of charge generation in ultra-thin oxides on silicon von Farmer, K.R., Debauche, C.P., Giordano, A.R., Lundgren, P., Andersson, M.O., Buchanan, D.A.

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Surface-potential dependence of interface-state passivation in metal-tunnel-oxide-silicon diodes von Andersson, MO, Lundgren, A, Lundgren, P

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Electron states and microstructure of thin a-C:H layers von Afanas'ev, VV, Stesmans, A, Andersson, MO

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Model based on trap-assisted tunneling for two-level current fluctuations in submicrometer metal-silicon-dioxide-silicon diodes von ANDERSSON, M. O, XIAO, Z, NORRMAN, S, ENGSTROÊM, O

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Effect of sodium modification on microstructure and mechanical properties of thick-walled AlSi6Cu2.5 rheocast component von WESSÉN, M., ANDERSSON, N.E., GRANATH, O.

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Packet switched radio channel congestion control method and corresponding device von C. M. THORNBERG,O. GRIMLUND,M. ANDERSSON

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