Defect dominated charge transport in amorphous Ta2O5 thin films von Fleming, R. M., Lang, D. V., Jones, C. D. W., Steigerwald, M. L., Murphy, D. W., Alers, G. B., Wong, Y.-H., van Dover, R. B., Kwo, J. R., Sergent, A. M.

Volltext

Resistivity dominated by surface scattering in sub-50 nm Cu wires von Graham, R. L., Alers, G. B., Mountsier, T., Shamma, N., Dhuey, S., Cabrini, S., Geiss, R. H., Read, D. T., Peddeti, S.

Volltext

Intermixing at the tantalum oxide/silicon interface in gate dielectric structures von Alers, G. B., Werder, D. J., Chabal, Y., Lu, H. C., Gusev, E. P., Garfunkel, E., Gustafsson, T., Urdahl, R. S.

Volltext

Degradation of individual cells in a module measured with differential IV analysis von Alers, G.B., Zhou, J., Deline, C., Hacke, P., Kurtz, S.R.

Volltext

Mid-gap trap states in CdTe nanoparticle solar cells von Bezryadina, A., France, C., Graham, R., Yang, L., Carter, S. A., Alers, G. B.

Volltext

Nitrogen plasma annealing for low temperature Ta2O5 films von Alers, G. B., Fleming, R. M., Wong, Y. H., Dennis, B., Pinczuk, A., Redinbo, G., Urdahl, R., Ong, E., Hasan, Z.

Volltext

Existence of an orientational electric dipolar response in C60 single crystals von ALERS, G. B, GOLDING, B, KORTAN, A. R, HADDON, R. C, THEIL, F. A

Volltext

Thermal stability of Ta2O5 in metal–oxide–metal capacitor structures von Chang, J. P., Steigerwald, M. L., Fleming, R. M., Opila, R. L., Alers, G. B.

Volltext

Spin-glass fluctuation statistics : mesoscopic experiments in CuMn von WEISSMAN, W. B, ISRAELOFF, N. E, ALERS, G. B

Volltext

Thermoreflectance imaging of defects in thin-film solar cells von Kendig, D, Alers, G B, Shakouri, A

Volltext

CdTe Schottky diodes from colloidal nanocrystals von Olson, J. D., Rodriguez, Y. W., Yang, L. D., Alers, G. B., Carter, S. A.

Volltext

Solar cell interface stability probed by charge extraction von Graham, R L, France, C E, Carter, S A, Alers, G B

Volltext

Universal-conductance-fluctuation 1/f noise in a metal-insulator composite von GARFUNKEL, G. A, ALERS, G. B, WEISSMAN, M. B, MOCHEL, J. M, VANHARLINGEN, D. J

Volltext

Effects of high-temperature annealing on the dielectric function of Ta2O5 films observed by spectroscopic ellipsometry von Nguyen, N. V., Richter, C. A., Cho, Yong Jai, Alers, G. B., Stirling, L. A.

Volltext

Electromigration induced resistance changes in a single aluminum via von Alers, G. B., Oates, A. S., Beverly, N. L.

Volltext

1/ f resistance noise in the large magnetoresistance manganites von Alers, G. B., Ramirez, A. P., Jin, S.

Volltext

Stress migration and the mechanical properties of copper von Alers, G.B., Sukamto, J., Woytowitz, P., Lu, X., Kailasam, S., Reid, J.

Volltext

1/ f noise through the metal–nonmetal transition in percolating composites von Breeze, A. J., Carter, S. A., Alers, G. B., Heaney, M. B.

Volltext

Quantum dot PbS sub(0.9)Se sub(0.1)/TiO sub(2) heterojunction solar cells von Zhai, G, Church, C P, Breeze, A J, Zhang, D, Alers, G B, Carter, SA

Volltext

Existence of an Orientational Electric Dipolar Response in C 60 Single Crystals von Alers, G. B., Golding, Brage, Kortan, A. R., Haddon, R. C., Theil, F. A.

Volltext