Treffer 1 - 10 von 10 für Suche 'ALAMPALLY SRINIVASULU', Suchdauer: 0,40s Treffer weiter einschränken
  1. 1
    Evaluation of Entropy Driven Compression Bounds on Industrial Designs

    Evaluation of Entropy Driven Compression Bounds on Industrial Designs von Alampally, S., Abraham, J., Parekhji, R.A., Kapur, R., Williams, T.W.


    Volltext
    Tagungsbericht

    Zu den Favoriten
    Gespeichert in:
  2. 2
    Scan-based MCM interconnect testing

    Scan-based MCM interconnect testing von V Prasanth, Shetty Milan, Alampally Srinivasulu

    Volltext bestellen
    Patent

    Zu den Favoriten
    Gespeichert in:
  3. 3
    SCAN-BASED MCM INTERCONNECT TESTING

    SCAN-BASED MCM INTERCONNECT TESTING von ALAMPALLY SRINIVASULU, V PRASANTH, SHETTY MILAN

    Volltext bestellen
    Patent

    Zu den Favoriten
    Gespeichert in:
  4. 4
    Scan-based MCM interconnecting testing

    Scan-based MCM interconnecting testing von ALAMPALLY SRINIVASULU, PRASANTH V, SHETTY MILAN

    Volltext bestellen
    Patent

    Zu den Favoriten
    Gespeichert in:
  5. 5
    SCAN-BASED MCM INTERCONNECTING TESTING

    SCAN-BASED MCM INTERCONNECTING TESTING von ALAMPALLY SRINIVASULU, PRASANTH V, SHETTY MILAN

    Volltext bestellen
    Patent

    Zu den Favoriten
    Gespeichert in:
  6. 6
    Interruptible non-destructive run-time built-in self-test for field testing

    Interruptible non-destructive run-time built-in self-test for field testing von GANGASANI SWATHI, PAREKHJI RUBIN AJIT, ALAMPALLY SRINIVASULU, SAMPATH PADMINI, CHAKRAVARTHY SRINIVASA B S, CHOWDHURY PROHOR

    Volltext bestellen
    Patent

    Zu den Favoriten
    Gespeichert in:
  7. 7
    On-chip seed generation using boolean functions for LFSR re-seeding based logic BIST techniques for low cost field testability

    On-chip seed generation using boolean functions for LFSR re-seeding based logic BIST techniques for low cost field testability von Gangasani, Swathi, Alampally, Srinivasulu, Divakaran, Divya, Parekhji, Rubin Ajit, Dutta, Amit Kumar, Ravi, Srivaths

    Volltext bestellen
    Patent

    Zu den Favoriten
    Gespeichert in:
  8. 8
    On-chip seed generation using boolean functions for LFSR re-seeding based logic BIST techniques for low cost field testability

    On-chip seed generation using boolean functions for LFSR re-seeding based logic BIST techniques for low cost field testability von GANGASANI SWATHI, DIVAKARAN DIVYA, PAREKHJI RUBIN AJIT, ALAMPALLY SRINIVASULU, DUTTA AMIT KUMAR, RAVI SRIVATHS

    Volltext bestellen
    Patent

    Zu den Favoriten
    Gespeichert in:
  9. 9
    INTERRUPTIBLE NON-DESTRUCTIVE RUN-TIME BUILT-IN SELF-TEST FOR FIELD TESTING

    INTERRUPTIBLE NON-DESTRUCTIVE RUN-TIME BUILT-IN SELF-TEST FOR FIELD TESTING von GANGASANI SWATHI, PAREKHJI RUBIN AJIT, ALAMPALLY SRINIVASULU, SAMPATH PADMINI, CHAKRAVARTHY SRINIVASA B S, CHOWDHURY PROHOR

    Volltext bestellen
    Patent

    Zu den Favoriten
    Gespeichert in:
  10. 10
    On-Chip Seed Generation Using Boolean Functions for LFSR Re-Seeding Based Logic BIST Techniques for Low Cost Field Testability

    On-Chip Seed Generation Using Boolean Functions for LFSR Re-Seeding Based Logic BIST Techniques for Low Cost Field Testability von GANGASANI SWATHI, DIVAKARAN DIVYA, PAREKHJI RUBIN AJIT, ALAMPALLY SRINIVASULU, DUTTA AMIT KUMAR, RAVI SRIVATHS

    Volltext bestellen
    Patent

    Zu den Favoriten
    Gespeichert in:

Suchwerkzeuge: