Position-Controlled Uniform GaAs Nanowires on Silicon using Nanoimprint Lithography von Munshi, A. M, Dheeraj, D. L, Fauske, V. T, Kim, D. C, Huh, J, Reinertsen, J. F, Ahtapodov, L, Lee, K. D, Heidari, B, van Helvoort, A. T. J, Fimland, B. O, Weman, H

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Atomic-scale 3D imaging of individual dopant atoms in an oxide semiconductor von Hunnestad, K. A., Hatzoglou, C., Khalid, Z. M., Vullum, P. E., Yan, Z., Bourret, E., van Helvoort, A. T. J., Selbach, S. M., Meier, D.

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Near-surface depletion of antimony during the growth of GaAsSb and GaAs/GaAsSb nanowires von Kauko, H., Fimland, B. O., Grieb, T., Munshi, A. M., Müller, K., Rosenauer, A., van Helvoort, A. T. J.

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Compositional analysis of GaAs/AlGaAs heterostructures using quantitative scanning transmission electron microscopy von Kauko, H., Zheng, C. L., Zhu, Y., Glanvill, S., Dwyer, C., Munshi, A. M., Fimland, B. O., van Helvoort, A. T. J., Etheridge, J.

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Controlling crystal phases in GaAs nanowires grown by Au-assisted molecular beam epitaxy von Dheeraj, D L, Munshi, A M, Scheffler, M, van Helvoort, A T J, Weman, H, Fimland, B O

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Characterization of ferroelectric domain walls by scanning electron microscopy von Hunnestad, K. A., Roede, E. D., van Helvoort, A. T. J., Meier, D.

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Processing and indexing of electron backscatter patterns using open-source software von Ånes, H W, Hjelen, J, Sørensen, B E, van Helvoort, A T J, Marthinsen, K

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Evaluating focused ion beam patterning for position-controlled nanowire growth using computer vision von Mosberg, A B, Myklebost, S, Ren, D, Weman, H, Fimland, B O, van Helvoort, A T J

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Moiré fringes in conductive atomic force microscopy von Richarz, L., He, J., Ludacka, U., Bourret, E., Yan, Z., van Helvoort, A. T. J., Meier, D.

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The effects of Sb concentration variation on the optical properties of GaAsSb GaAs heterostructured nanowires von Todorovic, J, Kauko, H, Ahtapodov, L, Moses, A F, Olk, P, Dheeraj, D L, Fimland, B O, Weman, H, van Helvoort, A T J

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Correlated micro-photoluminescence and electron microscopy study of a heterostructured semiconductor nanowire von Todorovic, J, Moses, A F, Dheeraj, D L, Olk, P, Fimland, B O, Weman, H, Helvoort, A T J van

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Zinc blende GaAsSb nanowires grown by molecular beam epitaxy von Dheeraj, D L, Patriarche, G, Largeau, L, Zhou, H L, van Helvoort, A T J, Glas, F, Harmand, J C, Fimland, B O, Weman, H

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Scanning precession electron diffraction data analysis approaches for phase mapping of precipitates in aluminium alloys von Thronsen, E., Bergh, T., Thorsen, T.I., Christiansen, E.F., Frafjord, J., Crout, P., van Helvoort, A.T.J., Midgley, P.A., Holmestad, R.

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Nanocrystal segmentation in scanning precession electron diffraction data von BERGH, T., JOHNSTONE, D.N., CROUT, P., HØGÅS, S., MIDGLEY, P.A., HOLMESTAD, R., VULLUM, P.E., HELVOORT, A.T.J. VAN

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Radial composition variations in the shells of GaAs AlGaAs core-shell nanowires von Nilsen, J S, Reinertsen, J F, Mosberg, A, Fauske, V T, Munshi, A M, Dheeraj, D L, Fimland, B O, Weman, H, van Helvoort, A T J

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In-situ electrical and structural characterization of individual GaAs nanowires von Fauske, V T, Kim, D C, Munshi, A M, Dheeraj, D L, Fimland, B-O, Weman, H, van Helvoort, A T J

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New avenues for residual stress analysis in ultrathin atomic layer deposited free-standing membranes through release of micro-cantilevers von Burgmann, S., Lid, M.J., Johnsen, H.J.D., Vedvik, N.P., Haugen, B., Provine, J., van Helvoort, A.T.J., Torgersen, J.

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Atomic resolution imaging of beryl: an investigation of the nano‐channel occupation von ARIVAZHAGAN, V., SCHMITZ, F.D., VULLUM, P.E., VAN HELVOORT, A.T.J., HOLST, B.

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Determination of GaAs zinc blende/wurtzite band offsets utilizing GaAs nanowires with an axial GaAsSb insert von Ahtapodov, L., Kauko, H., Munshi, A. M., Fimland, B. O., van Helvoort, A. T. J., Weman, H.

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Micro-photoluminescence study of single GaAsSb/GaAs radial and axial heterostructured core-shell nanowires von Moses, A F, Hoang, T B, Dheeraj, D L, Zhou, H L, Helvoort, A T J van, Fimland, B O, Weman, H

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