A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress von Živanović, Emilija, Veljković, Sandra, Mitrović, Nikola, Jovanović, Igor, Djorić-Veljković, Snežana, Paskaleva, Albena, Spassov, Dencho, Danković, Danijel

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Investigation of statistical behaviour of electrical breakdown voltage distribution for nitrogen‐filled diode at 13.3 mbar pressure von Živanović, Emilija N., Maluckov, Čedomir A.

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Xenon-filled diode performance under influence of low doses of gamma radiation von Pejović, Milić M., Živanović, Emilija N., Stojanović, Milan D.

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INVESTIGATION OF XENON-FILLED TUBE BREAKDOWN VOLTAGE AND DELAY RESPONSE AS POSSIBLE DOSIMETRIC PARAMETERS FOR SMALL GAMMA RAY AIR KERMA RATES von Pejović, Milić, Živanović, Emilija, Živanović, Miloš

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Study of Breakdown Voltage Stability of Gas-Filled Surge Arresters in the Presence of Gamma Radiation von Živanović, Emilija, Živković, Marija, Veljković, Sandra

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The Importance of Students' Practical Work in High Schools for Higher Education in Electronic Engineering von Dankovic, Danijel, Marjanovic, Milos, Mitrovic, Nikola, Zivanovic, Emilija, Dankovic, Milan, Prijic, Aneta, Prijic, Zoran

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The possibility for gamma and UV radiation detection based on electrical breakdown time delay measurement in krypton and xenon filled diodes von Pejovic, Milic, Zivanovic, Emilija, Belic, Cedomir

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Influence of combined gas and vacuum breakdown mechanisms on memory effect in nitrogen von Zivanovic, Emilija N

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EXTRACURRICULAR ACTIVITIES IN THE FUNCTION OF IMPROVING PRACTICAL SKILLS OF FUTURE STUDENTS IN THE FIELD OF ЕLECTRICAL ENGINEERING AND COMPUTING von Živanović, Emilija, Marjanović, Miloš, Danković, Danijel

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Kinetics of ions and neutral active states in the afterglow and their influence on the memory effect in nitrogen at low pressures von PEJOVIC, Momcilo M, ZIVANOVIC, Emilija N, PEJOVIC, Milic M

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Investigation of the effect of additional electrons originating from the ultraviolet radiation on the nitrogen memory effect von Zivanovic, Emilija

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Recovery Analysis of Sequentially Irradiated and NBT-Stressed VDMOS Transistors von Djorić-Veljković, Snežana, Živanović, Emilija, Davidović, Vojkan, Veljković, Sandra, Mitrović, Nikola, Ristić, Goran, Paskaleva, Albena, Spassov, Dencho, Danković, Danijel

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Analysis of processes responsible for the memory effect in air at low pressures von PEJOVIC, Momčilo M, ZIVANOVIC, Emilija N, PEJOVIC, Milić M, KARAMARKOVIC, Jugoslav P

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Investigation of breakdown voltage and electrical breakdown time delay in air-filled tube in presence of combined gas and vacuum breakdown mechanism von Pejovic, Momcilo M, Zivanovic, Emilija N, Pejovic, Milic M, Nesic, Nikola T, Kovacevic, Dragan

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The influence of additional electrons on memory effect in nitrogen at low pressures von Nesic, Nikola T, Pejovic, Momcilo M, Pejovic, Milic M, Zivanovic, Emilija N

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2023 International Conference on Microelectronics [Chapters] von Veljkovic, Sandra, Zivanovic, Emilija, Davidovic, Vojkan, Dankovic, Danijel

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Let’s All Go to the 16th IEEESTEC! [Chapters] von Veljkovic, Sandra, Marjanovic, Milos, Zivanovic, Emilija, Dankovic, Danijel

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The evolution of breakdown voltage and delay time under high overvoltage for different types of surge arresters von Zivanovic, Emilija, Zivkovic, Marija, Pejovic, Milic

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On the node ordering of progressive polynomial approximation for the sensor linearization von Prijic, Aneta, Ilic, Aleksandar, Prijic, Zoran, Zivanovic, Emilija, Randjelovic, Branislav

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Comparative study between homemade and commercial hawthorn (Crataegus spp.) extracts regarding their phenolic profile and antioxidant activity von Zivanovic, Nemanja, Simin, Natasa, Lesjak, Marija, Orcic, Dejan, Mimica-Dukic, Neda, Svircev, Emilija

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