Quantitative Phase Imaging of Thin Film Surface von Tiryaki, E., Kocahan, O., Ozder, S.

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Dielectric Studies of Tetraethylene Glycol−Bis(3-methylimidazolium) Dichloride (TEGDC) Exhibiting Large Negative Dielectric Anisotropy von Yakuphanoglu, F, Okutan, M, Köysal, O, Özder, S, Ocakoǧlu, K, İçli, S

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Investigation of optical parameters of Ag–In–Se thin films deposited by e-beam technique von Çolakoğlu, T., Parlak, M., Özder, S.

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Effect of an azo dye (DR1) on the dielectric parameters of a nematic liquid crystal system von Özder, S., Okutan, M., Köysal, O., Göktaş, H., San, S.E.

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Two-dimensional fringe projection for three-dimensional shape measurements by using the CWT phase gradient method von Kocahan Yilmaz, Ö., Özder, S., Demir, P.

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The Determination of Birefringence Dispersion in Nematic Liquid Crystals by Using the S-Transform von Coskun, E, Ozder, S, Kocahan, O, Koysal, O

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Continuous wavelet transform analysis of projected fringe patterns von Dursun, Ali, Özder, Serhat, Ecevit, F Necati

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Temperature dependence of the capture cross section determined by DLTS on an MOS structure von Ozder, S, Atilgan, I, Katircioglu, B

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Strong Ground Motion Seismology von Erdik, Mustafa Özder, Toksöz, M. Nafi

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Rapid determination of a-Si:H gap states by double-beam photocapacitance von Atilgan, I, Ozder, S, Katircioglu, B

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Properties of MOS capacitors produced on SiGe formed by Ge-implanted Si von ŞAHİN, M, ÖZDER, S, TURAN, R

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Influence of Annealing Temperature on the Electrical and Optical Properties of CdS Thin Films von Elmas, S., Ozcan, S., Ozder, S., Bilgin, V.

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Thickness measurement of dielectric films by wavelength scanning method von Köysal, Oğuz, Önal, Duygu, Özder, Serhat, Necati Ecevit, F.

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Holographic recording study of a hybrid liquid crystal system doped with dye and fullerene von Eren San, S., Köysal, Oğuz, Necati Ecevit, F., Özder, Serhat, Dvornikov, Dmitri

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Simultaneous determination of refractive index and thickness of multilayer dielectric films by discrete Fourier transform von Köysal, Oǧuz, Eren San, S., Özder, Serhat

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A novel approach for the determination of birefringence dispersion in nematic liquid crystals by using the continuous wavelet transform von Köysal, Oguz, San, S Eren, Özder, Serhat, Ecevit, F Necati

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Scattering of He from a Cu(110) surface von OZDER, S, ERKOC, S, ILTAN, E

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Admittance analysis of an MIS structure made with PECVD deposited a-SiNx:H thin films von ATILGAN, I, OZDER, S, OZDEMIR, O, KATIRCIOGLU, B

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Analysis of the standard deviation of surface potential fluctuations in MOS interface from DLTS spectra von Özder, Serhat, Atilgan, Ismail, Katircioglu, Bayram

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Effects of surface potential fluctuations on DLTS of MOS structure von Özder, Serhat, Atilgan, İsmai̇l, Katircioḡlu, Bayram

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