Noise Behavior of a 180 nm CMOS SOI Technology for Detector Front-End Electronics von Re, V., Gaioni, L., Manghisoni, M., Ratti, L., Speziali, V., Traversi, G., Yarema, R.

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Lessons Learned From BaBar Silicon Vertex Tracker, Limits, And Future Perspectives of the Detector von Re, V., /Bergamo U. /INFN, Pavia, Kirkby, D., Bruinsma, M., Curry, S., /UC, Irvine, Berryhill, J., Burke, S., Callahan, D., Campagnari, C., Dahmes, B., Hale, D., Hart, P., Kyre, S., Levy, S., Long, O., Mazur, M., Richman, J., Stoner, J., Verkerke, W., /UC, Santa Barbara, Beck, T., Eisner, A.M., Kroseberg, J., /UC, Santa Cruz /Ferrara U. /INFN, Ferrara /NIKHEF, Amsterdam /LBL, Berkeley /Maryland U. /Milan U. /INFN, Milan /Pavia U. /Pisa, Scuola Normale Superiore /INFN, Pisa /Princeton U. /SLAC /Stanford U., Phys. Dept. /Turin U. /INFN, Turin /Trieste U. /INFN, Trieste /Wisconsin U., Madison

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