DFM Evaluation Using IC Diagnosis Data von Blanton, Ronald D. Shawn, Fa Wang, Cheng Xue, Nag, Pranab K., Yang Xue, Xin Li

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LASIC: Layout Analysis for Systematic IC-Defect Identification Using Clustering von Tam, Wing Chiu Jason, Blanton, Ronald D.

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Improving Diagnosis Through Failing Behavior Identification von Xiaochun Yu, Blanton, R. D.

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Ultra-Low-Power Biomedical Circuit Design and Optimization: Catching the Don’t Cares von Li, Xin, (Shawn) Blanton, Ronald D., Grover, Pulkit, Thomas, Donald E.

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Machine Learning in Logic Circuit Diagnosis von Blanton, Ronald D. (Shawn), Fang, Chenlei, Huang, Qicheng, Mittal, Soumya

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Statistical Test Compaction Using Binary Decision Trees von Sounil Biswas, Blanton, R.D.

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Built-in self test of MEMS von Deb, Nilmoni, Blanton, Ronald D. Shawn

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Built-in self test of MEMS von DEB NILMONI, BLANTON RONALD D. SHAWN

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Yield Learning Through Physically Aware Diagnosis of IC-Failure Populations von Blanton, R. D., Tam, W. C., Xiaochun Yu, Nelson, J. E., Poku, O.

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