A new X-ray beam induced current setup, coupled with X-ray diffraction imaging, for diamonds and semiconductors characterization by synchrotron techniques at ESRF von Lafont, F., Baruchel, J., Bousquet, J., Capria, E., Celestre, R., Cotte, M., Dauvergne, D., Everaere, P., Gallin-Martel, M.L., Hoarau, C., Ibourk, O., Letellier, J., Molle, R., Muraz, J.-F., Nusimovici, D.Z., Reynaud, M., Tran-Caliste, T.N.

Volltext

X-Ray absorption studies of cubic boron–carbon–nitrogen films grown by ion beam assisted evaporation von Gago, R, Jiménez, I, Sajavaara, T, Rauhala, E, Albella, J.M

Volltext