Resolution Versus Error for Computational Electron Microscopy von Luzi, Lorenzo, Stevens, Andrew, Yang, Hao, Browning, Nigel D.

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Smart Align—a new tool for robust non-rigid registration of scanning microscope data von Jones, Lewys, Yang, Hao, Pennycook, Timothy J., Marshall, Matthew S. J., Van Aert, Sandra, Browning, Nigel D., Castell, Martin R., Nellist, Peter D.

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Atomap: a new software tool for the automated analysis of atomic resolution images using two-dimensional Gaussian fitting von Nord, Magnus, Vullum, Per Erik, MacLaren, Ian, Tybell, Thomas, Holmestad, Randi

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Sub-Ångstrom electric field measurements on a universal detector in a scanning transmission electron microscope von Hachtel, Jordan A., Idrobo, Juan Carlos, Chi, Miaofang

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SYRMEP Tomo Project: a graphical user interface for customizing CT reconstruction workflows von Brun, Francesco, Massimi, Lorenzo, Fratini, Michela, Dreossi, Diego, Billé, Fulvio, Accardo, Agostino, Pugliese, Roberto, Cedola, Alessia

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A fast image simulation algorithm for scanning transmission electron microscopy von Ophus, Colin

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A streaming multi-GPU implementation of image simulation algorithms for scanning transmission electron microscopy von Pryor, Alan, Ophus, Colin, Miao, Jianwei

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Towards on-the-fly data post-processing for real-time tomographic imaging at TOMCAT von Marone, Federica, Studer, Alain, Billich, Heiner, Sala, Leonardo, Stampanoni, Marco

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Dynamic scan control in STEM: spiral scans von Sang, Xiahan, Lupini, Andrew R., Unocic, Raymond R., Chi, Miaofang, Borisevich, Albina Y., Kalinin, Sergei V., Endeve, Eirik, Archibald, Richard K., Jesse, Stephen

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Big data and deep data in scanning and electron microscopies: deriving functionality from multidimensional data sets von Belianinov, Alex, Vasudevan, Rama, Strelcov, Evgheni, Steed, Chad, Yang, Sang Mo, Tselev, Alexander, Jesse, Stephen, Biegalski, Michael, Shipman, Galen, Symons, Christopher, Borisevich, Albina, Archibald, Rick, Kalinin, Sergei

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Deep data analysis via physically constrained linear unmixing: universal framework, domain examples, and a community-wide platform von Kannan, R., Ievlev, A. V., Laanait, N., Ziatdinov, M. A., Vasudevan, R. K., Jesse, S., Kalinin, S. V.

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Unsupervised machine learning applied to scanning precession electron diffraction data von Martineau, Ben H., Johnstone, Duncan N., van Helvoort, Antonius T. J., Midgley, Paul A., Eggeman, Alexander S.

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Analysis of crystal defects by scanning transmission electron microscopy (STEM) in a modern scanning electron microscope von Sun, Cheng, Müller, Erich, Meffert, Matthias, Gerthsen, Dagmar

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Optimal principal component analysis of STEM XEDS spectrum images von Potapov, Pavel, Lubk, Axel

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Feature extraction via similarity search: application to atom finding and denoising in electron and scanning probe microscopy imaging von Somnath, Suhas, Smith, Christopher R., Kalinin, Sergei V., Chi, Miaofang, Borisevich, Albina, Cross, Nicholas, Duscher, Gerd, Jesse, Stephen

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mpfit: a robust method for fitting atomic resolution images with multiple Gaussian peaks von Mukherjee, Debangshu, Miao, Leixin, Stone, Greg, Alem, Nasim

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An environmental transfer hub for multimodal atom probe tomography von Perea, Daniel E., Gerstl, Stephan S. A., Chin, Jackson, Hirschi, Blake, Evans, James. E.

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Fast approximate STEM image simulations from a machine learning model von Combs, Aidan H., Maldonis, Jason J., Feng, Jie, Xu, Zhongnan, Voyles, Paul M., Morgan, Dane

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Detecting magnetic ordering with atomic size electron probes von Idrobo, Juan Carlos, Rusz, Ján, Spiegelberg, Jakob, McGuire, Michael A., Symons, Christopher T., Vatsavai, Ranga Raju, Cantoni, Claudia, Lupini, Andrew R.

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Protein structural biology using cell-free platform from wheat germ von Novikova, Irina V., Sharma, Noopur, Moser, Trevor, Sontag, Ryan, Liu, Yan, Collazo, Michael J., Cascio, Duilio, Shokuhfar, Tolou, Hellmann, Hanjo, Knoblauch, Michael, Evans, James E.

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