Recent Advances in PMOS Negative Bias Temperature Instability Characterization and Modeling of Device Architecture, Material and Process Impact

Weitere Verfasser: “… Mahapatra, Souvik …”
DE-634
DE-1043
DE-1046
DE-Aug4
DE-1050
DE-573
DE-M347
DE-92
DE-898
DE-859
DE-860
DE-861
DE-863
DE-862
DE-523
DE-91
DE-706
DE-29
URL des Erstveröffentlichers

Fundamentals of bias temperature instability in MOS transistors characterization methods, process and materials impact, DC and AC modeling

Weitere Verfasser: “… Mahapatra, Souvik …”
DE-634
DE-1043
DE-1046
DE-Aug4
DE-573
DE-92
DE-898
DE-859
DE-861
DE-863
DE-862
DE-706
URL des Erstveröffentlichers
Inhaltsverzeichnis
Abstract