Evolution of Thin Film Morphology Modeling and Simulations von Pelliccione, Matthew, Lu, Toh-Ming 1943-

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Metal-Dielectric Interfaces in Gigascale Electronics Thermal and Electrical Stability von He, Ming, Lu, Toh-Ming 1943-

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Evolution of thin film morphology modeling and simulations von Pelliccione, Matthew, Lu, Toh-Ming

Metal-Dielectric Interfaces in Gigascale Electronics thermal and electrical stability von He, Ming, Lu, Toh-Ming 1943-

Evolution of thin film morphology modeling and simulations von Pelliccione, Matthew, Lu, Toh-Ming

Pulsed and pulsed bias sputtering principles and applications von Barnat, Edward V., Lu, Toh-Ming

Pulsed and Pulsed Bias Sputtering Principles and Applications von Barnat, Edward V., Lu, Toh-Ming

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Characterization of amorphous and crystalline rough surface principles and applications von Zhao, Yiping, Wang, Gwo-Ching, Lu, Toh-Ming

Diffraction from rough surfaces and dynamic growth fronts von Yang, Hong-Ning, Wang, Gwo-Ching, Lu, Toh-Ming

Synthesis and applications in microelectronics symposium held April 17 - 19, 1995, San Francisco, California, USA

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